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Gran Área: Ingeniería, ciencia y tecnología
Área: Ingeniería eléctrica, electrónica y de la información
Subárea: Hardware y arquitectura de computadores

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Resultado: 55 registro(s)

4149

Reconfigurable Computing

Architectures and Applications: Second International Workshop, ARC 2006, Delft, The Netherlands, March 1-3, 2006 Revised Selected Papers Vol. 3985

 

13th ed. Berlin, Heidelberg: Springer-Verlag GmbH, 2006.

Título de la serie/colección: Lecture Notes in Computer Science. ISSN 0302-9743,

ISBNs 9783540367086 9783540368632

Colección: SpringerLink


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4152

Reconfigurable Computing

Architectures, Tools and Applications: Third International Workshop, ARC 2007, Mangaratiba, Brazil, March 27-29, 2007. Proceedings Vol. 4419

 

13th ed. Berlin, Heidelberg: Springer-Verlag, 2007.

Título de la serie/colección: Lecture Notes in Computer Science. ISSN 0302-9743,

ISBNs 9783540714309 9783540714316

Colección: SpringerLink


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6304

Reliable Distributed Systems

Technologies, Web Services, and Applications

 

13th ed. New York, NY: Springer Science+Business Media, 2005.

ISBNs 9780387215099 9780387276014

Colección: SpringerLink


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5900

Scalable Hardware Verification with Symbolic Simulation

 

13th ed. Boston, MA: Springer Science+Business Media, 2006.

ISBNs 9780387244112 9780387299068

Colección: SpringerLink


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5905

Software-Implemented Hardware Fault Tolerance

 

13th ed. Boston, MA: Springer Science+Business Media, 2006.

ISBNs 9780387260600 9780387329376

Colección: SpringerLink


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5911

System-Level Design Techniques for Energy-Efficient Embedded Systems

 

13th ed. Boston, MA: Springer Science+Business Media, 2005.

ISBNs 9781402077500 9780306487361

Colección: SpringerLink


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8227

System-level Test and Validation of Hardware/Software Systems

Vol. 17

 

13th ed. London: Springer-Verlag, 2005.

Título de la serie/colección: Springer Series in Advanced Microelectronics. ISSN 1437-0387,

ISBNs 9781852338992 9781846281457

Colección: SpringerLink


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21082

System-on-Chip Test Architectures

Nanometer Design for Testability

 

Morgan Kaufmann, 2008.

ISBNs 9780123739735

Colección: ScienceDirect

Resumen (en inglés): Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost.

This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.

KEY FEATURES
* Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples.
* Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book.
* Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits.
* Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing.
* Practical problems at the end of each chapter for students.


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9782

SystemC Kernel Extensions for Heterogeneous System Modeling

A framework for Multi-MoC Modeling & Simulation

 

13th ed. Boston, MA: Springer Science+Business Media, 2005.

ISBNs 9781402080876 9781402080883

Colección: SpringerLink


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5906

SystemVerilog for Design

A Guide to Using SystemVerilog for Hardware Design and Modeling

 

2nd ed. Boston, MA: Springer Science+Business Media, 2006.

ISBNs 9780387333991 9780387364957

Colección: SpringerLink


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